|WEPGW027||Evaluation and Reduction of Influence of Filling Pattern on X-Ray Beam Position Monitors for SPring-8||2526|
SPring-8 constantly provides various several-bunch mode operations, which combine single bunches and train bunches. Recently, influence of filling pattern on the accuracy of the XBPMs became apparent, so that we started a systematic evaluation. It was found that the influence was caused by suppression of current signal due to space charge effect, which could be quantified by observing a behaviour of the current signal while changing the voltage of photoelectron collecting electrodes. In order to mitigate the space charge effect, we examined some methods, such as, changing operation parameters of the XBPMs and the undulators. As a result, we successfully reduced the influence of filling pattern.
* H. Aoyagi et al., Proc. of PASJ2018 WEOL06
|DOI •||reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2019-WEPGW027|
|About •||paper received ※ 10 May 2019 paper accepted ※ 17 May 2019 issue date ※ 21 June 2019|
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