Author: Chen, T.
Paper Title Page
THPMP016 Design of the Condenser System and Imaging System for a UEM 3485
SUSPFO054   use link to see paper's listing under its alternate paper code  
  • T. Chen, W. Li, Y.J. Pei
    USTC/NSRL, Hefei, Anhui, People’s Republic of China
  The ultrafast electron microscope provides a useful tool for exploring fine structure and observing dynamic process at nanometer and picosecond scale, which has been extensively applied in chemistry and biological field. After emitting from the electron gun, electron beams are focused on the stage sample by the condenser system and then be projected by the imaging system on the screen. In the present study, a two-lens condenser system is simulated by Parmela and a three-lens imaging system is designed using thin-lens approximation. Besides, the shape factor of metallic spheres which have different radius for perturbation method is measured, which is conductive to measuring the Z/Q parameter and the electric field along the axis of the C-band 3MeV photocathode gun for the UEM.  
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About • paper received ※ 14 May 2019       paper accepted ※ 22 May 2019       issue date ※ 21 June 2019  
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