Author: Gordon, M.A.
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WEPTS069 The Effects of Stochastic Space Charge in High Brightness Photolectron Beamlines for Ultrafast Electron Diffraction 3283
SUSPFO124   use link to see paper's listing under its alternate paper code  
  • M.A. Gordon, Y.K. Kim
    University of Chicago, Chicago, Illinois, USA
  • J.M. Maxson
    Cornell University, Ithaca, New York, USA
  • J.M. Maxson
    Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
  Funding: This work was supported by the U.S. National Science Foundation under award PHY-1549132, the Center for Bright Beams.
As we move to ultra-high brightness photocathodes and ultra-cold beams, we may become more sensitive to stochastic, point-to point effects such as disorder induced heating and the Boersch effect, given the failure of Debye screening.  In this study, we explore the effects of stochastic scattering. Modern beam dynamics codes often approximate point to point interactions with a potential created by smoothing the charge over space, removing sensitivity to stochastic effects. This approximation is often used in beamline optimization, because it is much faster. We study the limits of validity of this approximation. In particular, we will simulate effects of stochastic space charge on a high brightness photoemission beamline, an ultrafast electron diffraction beamline with a photocathode temperature of 5 meV with a final beam energy of 225 keV. Emittance dilution in the transverse plane and transverse beam size relative to smooth space charge simulations will be presented.
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About • paper received ※ 13 May 2019       paper accepted ※ 22 May 2019       issue date ※ 21 June 2019  
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