Author: Hogge, J.P.
Paper Title Page
TUPGW108 Characterization of NEG Coatings for SLS 2.0 1662
  • M.M. Dehler, A. Citterio
    PSI, Villigen PSI, Switzerland
  • S. Alberti, J.P. Hogge
    SPC-EPFL, Lausanne, Switzerland
  • M. Hahn, H.P. Marques
    ESRF, Grenoble, France
  • X.Y. Liu
    USTC/NSRL, Hefei, Anhui, People’s Republic of China
  To limit desorption and ameliorate pumping of the narrow 20 mm aperture vacuum chamber of SLS2.0, it is planned to fully coat it with nonevaporable getter (NEG) material. NEG coating can be produced with different structural characteristics, from dense films to columnar growth, with corresponding distinct electrical properties affecting the machine impedance and the instability threshold of the accelerator. In order to evaluate and characterize the coating process for geometries similar to the SLS chamber, we measured the resonance properties of coated and uncoated shorted waveguide pieces. First tests were done with standard X band waveguides at 12 and 7 GHz. Test setups using elliptical cross sections are in preparation, also for higher frequencies allowing the characterization of thin NEG layers. The final goal is to have a standardized process to test of samples coated by external producers. We describe the setups and first results.  
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About • paper received ※ 10 May 2019       paper accepted ※ 22 May 2019       issue date ※ 21 June 2019  
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