Author: Grebentsov, A.Yu.
Paper Title Page
THPGW051 MCP Based Detectors of European XFEL 3703
  • E. Syresin, O.I. Brovko, A.Yu. Grebentsov
    JINR, Dubna, Moscow Region, Russia
  • W. Freund, J. Grünert
    EuXFEL, Schenefeld, Germany
  • M.V. Yurkov
    DESY, Hamburg, Germany
  Radiation detectors based on microchannel plates (MCP) are used for measurements of the SASE process of the European XFEL. Detectors operate in a wide dynamic range from the level of spontaneous emission to the saturation level (between a few nJ and 25 mJ) and in a wide wavelength range from 0.05 nm to 0.4 nm for SASE1 and SASE2 and from 0.4 nm to 4.43 nm for SASE3. Photon pulse energies are measured by the MCPs with an anode and by a photodiode. The MCP imager measures the photon beam image with a phosphor screen. Three MCP detectors are installed, one behind each SASE undulator (SASE1, SASE2, and SASE3). Calibration and first experiments with the MCP detectors are under discussion.  
DOI • reference for this paper ※  
About • paper received ※ 29 April 2019       paper accepted ※ 23 May 2019       issue date ※ 21 June 2019  
Export • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)